From Fail to Win: Learning from Bad Ideas. Military and Government Technology by Ian Graham,Ian Graham

Niedriger Lagerbestand: 2 verbleibend

236mm x 166mm x 3mm

Seiten: 56

Have you ever wondered what went wrong when inventions, structures and technology failed spectacularly This series provides exciting, cross-curricular, high interest reads into ideas and projects from around the world that did not work as planned.